6-inch Aperture Fizeau Interferometer
Operates at 3392 nm and 635 nm
6-inch aperture Model 6339irVIS interferometer operates in two modes:
Infrared or Visible -- selectable with a switch. The Model 6339irVIS
is the 6-inch version of the Model 339irVis shown at the right.
The instrument features a Zinc Selenide collimator and reference surface
which is flat to 1/20 wave (measured at 632.8 nM). Two separate lasers
are employed -- A Helium-Neon Laser operating at 3392 nm and a single mode
Diode Laser operating at 635 nm. Both are dithered to produce speckle-free
live interferograms on the computer monitor.
The Model 339irVIS is quipped with two Cameras: a broadband Infrared camera and a standard CCD camera with 768x494 resolution for the 635 nm mode.Two options are offered for the Infrared camera: Low Resolution at 320x256 pixels, and High Resolution at 640x512 pixels. This phase-shifting Fizeau interferometer utilizes piezo-electric phase shifters and Durango Universal Interferometry Software to permit the operator to achieve highly accurate and repeatable measurements at both infrared and visible wavelengths.
In typical usage of a Dual Wavelength Interferometer, the operator can align his optical system and perform any necessary tip/tilt operations with the interferometer in VISIBLE MODE -- greatly simplifying the procedure.
ADVANTAGES OF A DUAL WAVELENGTH INTERFEROMETER
in the VISIBLE MODE, surface flatness measurements may be made at
the higher accuracy 635 nm wavelength. The interferometer can then be put
into the fully aligned IR MODE with the simple flip of a switch
These interferometers are provided complete with
Interferometry Software installed
in a fully configured 2.2 GHz Computer with Intel Dual Core Processor complete
with a 22-inch TFT flat screen monitor..
For Further Information, call Gordon Graham today at (818) 700-1263 E-Mail: email@example.com
Graham Optical Systems, 9530 Topanga Canyon Blvd., Chatsworth, CA 91311
Copyright © 2013 Graham Optical Systems All Rights Reserved *Durango is a trademark of Diffraction International
This page last updated April 22, 2013