Model 339ir
Infrared Fizeau Interferometer

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The 4-inch aperture Model 339ir Phase-shifting Fizeau is the most economical of any available interferometer operating at 3.39 micron wavelength . By utilizing a unique design developed by Graham Optical Systems, costs have been cut dramatically while maintaining the highest quality of performance.

The collimator and reference surface are integral to the interferometer resulting in improved infrared throughput while eliminating additional costly components. Fabricated from optical grade silicon, the reference surface is flat to 1/10 wave measured at 632.8 nM (better than 1/50 wave at 3392 nM).  An internal Helium Neon laser provides the Model 339ir with a safe and stable source of 3.392 micron radiation to produce a high contrast, speckle-free interferogram. Two options are offered for the Infrared camera: Low Resolution at 320x256 pixels, and High Resolution at 640x512 pixels. This turnkey instrument needs no additional Transmission flat for Plano work.
FEATURE
DESCRIPTION
Aperture  4-inches (101.6 mm)
Infrared Laser 2.0 mW Helium-Neon Laser at 3392 nM wavelength
Infrared Camera Lens (3392 nM)  100 mm Zinc Selenide Lens
1/50 wave reference surface No additional Transmission Flat required
Alignment Mode Two Spot Alignment 
Collimator / Reference Surface  Optical Grade Silicon
Configuration Fizeau Plano Configuration
Intensity Adjustment Remote control
Image brightness and contrast controls Accessible from rear surface of interferometer
Live Fringes on Computer Monitor High contrast speckle-free image
Two Camera Options:  Low and High resolution 320x256 pixels or 640x512 pixels
Phase Shifter Piezo-electric under control of Durango Software.
Accuracy (uncalibrated) 1/50 wave at 3392 nM
Accuracy (calibrated) 1/250 wave at 3392 nM
Repeatability 1/300 wave PV, 1/1000 wave rms
Dimensions (L x W x H) 24.0 x 18 x 9.7 inches
(61 x 45 x 24.6 cm)
Computer and 22-inch Monitor Included 2.2 GHz Computer with Intel Dual Core
Weight 75 pounds (34 kg)
Durango Universal Interferometry Software Data Acquisition and measurement process under Durango control
Windows environment
PV and rms in users choice of units
High level of repeatability
Excellent reproducibility
Large choice of graphic displays
Dynamic Sections
3-D OPD Plot
Reference Subtraction
MTF and PSF graphics and plots
Zernike Polynomials available for all measurements
Seidel Coefficients available
Data Acquisition Time 30 milliseconds (typical)
Data Reduction Time ?3 seconds (typical)
Test Beam Height 5.25 inches ( 13.3 cm)
Warmup Time  30 minutes

For further Information, call Gordon Graham today at  (818) 700-1263   E-mail techinfo@grahamoptical.com
Graham Optical Systems,   9530 Topanga Canyon Blvd.,   Chatsworth, CA 91311
Copyright © 2012 Graham Optical Systems  All Rights Reserved
*Durango is a trademark of Diffraction International
This page last updated May 21, 2012