New Model 106irVIS Dual Wavelength

1060nm / 635nm Interferometer


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The new version of our Model 106irVIS Dual-Wavelength Fizeau Interferometer operates in two modes: Infrared or Visible -- switch selectable. The  Model 106ir features a fused silica collimator and includes a Transmission Flat with standard bayonet mount (1/20 wave measured at 632.8 nm). The interferometer utilizes as single SWIR camera for greater simplicity as well as improved contrast and sensitivity. Offered in both Standard Resolution (320x256 pixels) and High Resolution (640x512 pixels) the Model 106irVIS features a fused silica collimator and includes a Transmission Flat with standard bayonet mount (1/20 wave measured at 632.8 nM)  Two separate lasers are employed – 1064 nm single-mode diode laser and a 635 nm single-mode Diode Laser.  Both sources are dithered to produce speckle-free live images on the computer monitor.

The Model 106irVIS utilizes our Frequency-Shifting EndoPhazeTM for hysteresis-free phase shifting.  Durango Universal Interferometry Software allows the operator to achieve highly accurate and repeatable measurements at both infrared and visible wavelengths. In typical usage of a Dual-Wavelength Interferometer, the operator can align his optical system and perform any necessary tip/tilt operations with the interferometer in VISIBLE MODE—greatly simplifying the procedure.

Featuring Zoom optics, with remote control of Zoom, Focus, Iris and Illumination intensity, the Model 106irVIS is equipped with a 2.93 GHz Computer including a 22-inch TFT flat screen monitor. 
Dual wavelength 1064nm and 635nm  Alignment of two wavelength optical paths is coaxial
4-inch aperture  Ideal for test pieces from 1/2 to 4 inch diameter
Fused silica reference surface 1/20 wave at 635nm  (1/32 wave at 1064nm)
4X ZOOM Lens for both wavelengths Remote control for quick, hands-off operation
Rugged construction High mechanical stability
A Turnkey System User Friendly and ready to go
Two spot alignment For quick setup on each new part tested.  Setup of test piece at either wavelength is aligned at both wavelengths
Dithered Laser sources at 1064nm and 635nm Sharp Speckle-free interferogram at both wavelengths
Zoom, Focus, Iris, Intensity Remote control for quick adjustments
EndoPhazeTM Frequency-Shifting For smooth hysteresis-free Phase-Shifting
SWIR Camera with enhanced performance at 635nm offered in either Standard or High Resolution Standard Resolution   (320x256 pixels)
High Resolution         (640x512 pixels)
Windows environment
PV and rms in users choice of units
High level of repeatability
Excellent reproducibility
Large choice of graphic displays
Dynamic Sections
3-D OPD Plot
Reference Subtraction
MTF and PSF graphics and plots
Zernike Polynomials available for all measurements
Seidel Coefficients available
2.93 GHz computer with INTEL® Core™ i-3 540 processor For high speed data reduction and phase shift control
22-inch TFT Flat Screen Monitor For easy viewing
Live interferogram on computer monitor For quick inspection with no extra video monitor
Configured for Plano or Spherical operation Includes Tip/Tilt plate to accommodate either T-Flats or T-Spheres (T-Spheres available, but not included)
Single Camera for both infrared and visible wavelengths For simpler operation.
High Accuracy  1/32 wave at 1064nm, 
1/20 wave at 632.8nm
Repeatability 1/300 wave PV,  1/1000 wave rms
Reproducibility Excellent
Data acquisition time 30 milliseconds (typical) Fast
Data reduction time  ~3 seconds (typical) Fast
Dimensions (L x W x H) 20 x 18 x 10 (inches) Small footprint
Weight 75 pounds (34 kg) approximately Solidly built for high stability
Manual Illustrated Operator's Manual
Warranty Standard one-year limited warranty against defective components or workmanship

Graham Optical Systems,   9530 Topanga Canyon Blvd., Chatsworth,   California 91311
For Further Information today, call Gordon Graham today at (818) 700-1263    E-mail: 
Copyright © 2014 Graham Optical Systems  All Rights Reserved 
EndoPhazeTM is a trademark of Graham Optical Systems     * Durango is a trademark of Diffraction International
This page last updated July 15, 2014